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Top 1200 reliability PDF Book Page 43

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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

authorAlvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III
pages643 Pages
release year2009
file size5.377 MB

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Reliability of High-Power Mechatronic Systems 2: Aerospace and Automotive Applications Issues,Testing and Analysis

authorAbdelkhalak El Hami (editor), David Delaux (editor), Henri Grzeskowiak (editor)
pages293 Pages
release year2017
file size13.741 MB

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