A recent technological advance is the art of designing circuits  to test themselves, referred to as a Built-In Self-Test (BIST). This  idea was first proposed around 1980 and has grown to become one of the  most important testing techniques at the current time, as well as for  the future. This book is written from a designer's perspective and  describes the major BIST approaches that have been proposed and  implemented since 1980, along with their advantages and limitations.  The BIST approaches include the Built-In Logic Block Observer,  pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST,  BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal  BIST, and the integration of BIST with concurrent fault detection  techniques for on-line testing. Particular attention is paid to  system-level use of BIST in order to maximize the benefits of BIST  through reduced testing time and cost as well as high diagnostic  resolution. The author spent 15 years as a designer at Bell Labs where  he designed over 20 production VLSI devices and 3 production circuit  boards. Sixteen of the VLSI devices contained BIST of various types  for regular structures and general sequential logic, including the  first BIST for Random Access Memories (RAMs), the first completely  self-testing integrated circuit, and the first BIST for mixed-signal  systems at Bell Labs. He has spent the past 10 years in academia where  his research and development continues to focus on BIST, including the  first BIST for FPGAs and CPLDs along with continued work in the area  of BIST for general sequential logic and mixed-signal systems. He  holds 10 US patents (with 5 more pending) for various types of BIST  approaches. Therefore, the author brings a unique blend of knowledge  and experience to this practical guide for designers, test engineers,  product engineers, system diagnosticians, and managers.

A Designer s Guide to Built-in Self-Test PDF

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